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MCNT-500™​
Amorphous CNT for in-line depth metrology

AFM TIP
​TIP
Precise post-like shape and orientation.
A true 24/7 fab workhorse with
500 nm length and 30 nm diameter.
Download full spec sheet
AFM CANTILEVER
APPLICATION
In-Line semiconductor process monitoring: Quality control for Fin oxide recess with MCNT-100™ Park AAFM.
Link to publication
nanotools COMPATIBILITY
COMPATIBILITY
Compatible with all major
commercially available AFM's. 
Featuring standard cantilevers
and chip dimensions.
nanotools ISO 9001
QUALITY CONTROL
ISO 9001 certified since 2008.
Every probe measured and quality inspected, datasheet with exact
TrueDimensions
™ of every probe.

Hours
M-F: 8am - 6pm PT

Phone
844-ebd-tips
844-323-8477

Email
info-usa@nanotools.com

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