MCNT-500™​
Amorphous CNT for in-line depth metrology

​TIP
Precise post-like shape and orientation.
A true 24/7 fab workhorse with
500 nm length and 30 nm diameter.
Download full spec sheet

APPLICATION
In-Line semiconductor process monitoring: Quality control for Fin oxide recess with MCNT-100™ Park AAFM.
Link to publication

COMPATIBILITY
Compatible with all major
commercially available AFM's. 
Featuring standard cantilevers
and chip dimensions.

QUALITY CONTROL
ISO 9001 certified since 2008.
Every probe measured and quality inspected, datasheet with exact TrueDimensions™ of every probe.