Amorphous CNT for in-line depth metrology
Precise post-like shape and orientation.
A true 24/7 fab workhorse with
500 nm length and 30 nm diameter.
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In-Line semiconductor process monitoring: Quality control for Fin oxide recess with MCNT-100™ Park AAFM.
Link to publication
Compatible with all major
commercially available AFM's.
Featuring standard cantilevers
and chip dimensions.
ISO 9001 certified since 2008.
Every probe measured and quality inspected, datasheet with exact TrueDimensions™ of every probe.