Amorphous CNT for in-line depth metrology
Precise post-like shape and orientation.
A true 24/7 fab workhorse with
500 nm length and 30 nm diameter.
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In-Line semiconductor process monitoring: Quality control for Fin oxide recess with MCNT-100™ Park AAFM.
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Compatible with all major
commercially available AFM's.
Featuring standard cantilevers
and chip dimensions.