The amorphous CNT solution: ultrathin AFM tips for demanding metrology applications.
f = 320 kHz | k = 40 N/m | l = 100 nm | w = 10 nm
Precisely controlled tip length of 100 nm.
Tip width of 10 nm: outstanding access capabilities to finest features.
Tilt compensation of 3° or 12° to ensure maximum compatibility with the most advanced AAFM systems.
Delivered with TrueDimensions™:
- SEM image of every tip
- Each tip length and width measured in Hi-Res SEM
- Datasheet for every single probe available 24/7 via QR code
Currently not available online.
Ships in less than 4 weeks.