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  • CDR50-EBD

CDR50-EBD

SKU: NT_CDR50_v0010
$0.00
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T-shape-like CDR AFM tips for improved reliability and throughput in 3D CD metrology applications.

f = 320 kHz  |  k = 40 N/m  |  effect. length = 200 nm | w = 50 nm


Description:

Tip widths of 50 nm for the reconstruction of finest 3D reentrant structures.

5 nm tip edge radius for high resolution sidewall roughness measurements.

Significantly improved lifetime compared to CD AFM tips made from silicon.


Delivered with TrueDimensions™:

- SEM image of every tip

- Each tip length and width measured in Hi-Res SEM

- Datasheet for every single probe available 24/7 via QR code


Full Technical Data


Real Life Applications


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Ships in less than 4 weeks.

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