Supersharp carbon AFM tips for the inspection of very fine high aspect ratio features .
f = 75 kHz | k = 2.8 N/m | l = 80 nm | r = 2 nm
Down to 8 nm tip width at 50 nm depth.
Tip apex radius of 2 nm for ultrahigh resolution AFM imaging on HAR features.
For automated non-contact imaging.
Delivered with TrueDimensions™:
- SEM image of every tip
- Each tip length and width measured in Hi-Res SEM
- Datasheet for every single probe available 24/7 via QR code
Full Technical Data
Currently not available online.
Ships in less than 4 weeks.