The amorphous CNT solution for depth metrology applications.
f = 320 kHz | k = 42 N/m | l = 500 nm | w = 36 nm
Controlled tip length of 500 nm.
Tip width of 36 nm: access capabilities to fine features.
Tilt compensation of 3° or 12° to ensure maximum compatibility with the most advanced AAFM systems.
Full Technical Data
Ships in less than 2 weeks.