Microlens CIS (Contact Image Sensor) Probe for automated non-contact AFM.
f = 320 kHz | k = 40 N/m | r = 10 nm
Robust diamond-like carbon tip with aspect ratio > 5.
400 nm long conical tip for automated non-contact measurements.
Optional non-ESD coating to avoid static charge or 55 nm round post tip for depth metrology.
Delivered with TrueDimensions™:
- SEM image of every tip
- Each tip length and radius measured in Hi-Res SEM
- Datasheet for every single probe available 24/7 via QR code
Need a customized solution? Request a quote.
Ships in less than 2 weeks.