nanotools usa
nanotools usa
  • Home
  • Products
    • Featured Probes
    • All Standard Probes
    • Build-A-Probe™
  • Company
    • About
    • Patented Technology
  • TrueDimensions™
  • Blog
  • Privacy
  • Home
  • Products
    • Featured Probes
    • All Standard Probes
    • Build-A-Probe™
  • Company
    • About
    • Patented Technology
  • TrueDimensions™
  • Blog
  • Privacy
  • EBD Xpress Catalog
  • >
  • Industry Metrology
  • >
  • M-CIS

M-CIS

SKU: NT_MCIS_v0020
$950.00
$950.00
Unavailable
per item

Microlens CIS (Contact Image Sensor) Probe for automated non-contact AFM.

f = 320 kHz  |  k = 40 N/m  |  r = 10 nm


Description:

Robust diamond-like carbon tip with aspect ratio > 5.

400 nm long conical tip for automated non-contact measurements.

Optional non-ESD coating to avoid static charge or 55 nm round post tip for depth metrology.


Delivered with TrueDimensions™:

- SEM image of every tip

- Each tip length and radius measured in Hi-Res SEM

- Datasheet for every single probe available 24/7 via QR code


Full Technical Data


Need a customized solution? Request a quote.


Ships in less than 2 weeks.

Add to Cart

Hours
M-F: 8am - 6pm PT

Phone
844-ebd-tips
844-323-8477

Email
info-usa@nanotools.com

Tip Handling
How to buy
Terms and conditions
Shipping Methods
Return/Refund
Privacy
Contact

Disclaimer
​Impressum​​
© 2022 nanotools USA LLC. All rights reserved.