M-CIS

SKU: NT_MCIS_v0020
$950.00
$950.00
Unavailable
per item

Microlens CIS (Contact Image Sensor) Probe for automated non-contact AFM.

f = 320 kHz  |  k = 40 N/m  |  r = 10 nm


Description:

Robust diamond-like carbon tip with aspect ratio > 5.

400 nm long conical tip for automated non-contact measurements.

Optional non-ESD coating to avoid static charge or 55 nm round post tip for depth metrology.


Delivered with TrueDimensions™:

- SEM image of every tip

- Each tip length and radius measured in Hi-Res SEM

- Datasheet for every single probe available 24/7 via QR code


Full Technical Data


Need a customized solution? Request a quote.


Ships in less than 2 weeks.