- EBD Xpress Catalog
- Industry Metrology
High performance replacements for FIB silicon AFM tips.
Extreme Aspect Ratio for enhanced depth profiling.
f = 320 kHz | k = 40 N/m | r < 5 nm
Tilt compensated for extended access to steep features.
Conical shape for improved mechanical stability.
HDC/DLC durability for long-lasting performance.
Delivered with TrueDimensions™:
- SEM image of every tip
- Each tip length and width at 5000 nm from apex measured in Hi-Res SEM
- Datasheet for every single probe available 24/7 via QR code
Need a customized solution? Request a quote.
Ships in less than 2 weeks.