Ultrahigh tip sharpness for non-contact AFM.
Diamond like hardness, long lifetime and imaging stability.
f = 320 kHz | k = 40 N/m | r = 2 nm
SuperSharp Enhanced AFM tips for ultrahigh resolution AFM scanning and critical surface roughness metrology.
HDC/DLC durability for long-lasting tip performance and automated non-contact imaging.
Delivered with TrueDimensions™:
- SEM image of every tip
- Each tip radius measured in Hi-Res SEM
- Datasheet for every single probe available 24/7 via QR code
Full Technical Data
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Ships in less than 2 weeks.