- EBD Xpress Catalog
- Industry Metrology
- SuperSharp Enhanced
Ultrahigh tip sharpness for non-contact AFM.
Diamond like hardness, long lifetime and imaging stability.
f = 320 kHz | k = 40 N/m | r = 2 nm
SuperSharp Enhanced AFM tips for ultrahigh resolution AFM scanning and critical surface roughness metrology.
HDC/DLC durability for long-lasting tip performance and automated non-contact imaging.
Delivered with TrueDimensions™:
- SEM image of every tip
- Each tip radius measured in Hi-Res SEM
- Datasheet for every single probe available 24/7 via QR code
Need a customized solution? Request a quote.
Ships in less than 2 weeks.