- EBD Xpress Catalog
- Industry Metrology
Ultrahigh tip sharpness and softer cantilevers for uninterrupted AFM operation in force-controlling scanning modes.
f = 60 kHz | k = 0.4 N/m | r = 2 nm
The perfect tipfor ultrahigh resolution AFM scanning and critical surface roughness metrology.
Consistent cantilever and tip dimensions for excellent measurement repeatability.
Delivered with TrueDimensions™:
- SEM image of every tip
- Each tip radius measured in Hi-Res SEM
- Datasheet for every single probe available 24/7 via QR code
Need a customized solution? Request a quote.
Ships in less than 2 weeks.